大會徵稿

徵稿期間:
投稿系統開放日~ 2026 年 5 月 12 日止
論文錄取通知日:2026 年 6 月 18 日

備註:
論文經錄取後,須至少一位作者註冊並出席發表或海報展示說明。大會設有最佳論文(Best Paper)獎項,歡迎各界踴躍投稿,共同參與難得的年度盛會。
*獲選 Best Papers 將推薦至 IJEE Special Issue

論文格式:
限以英文書寫,請用 A4 Double-Column 9pt 格式,2~4 頁為限,檔案大小不得超過 10MB。 論文撰寫請參照 IEEE 標準格式,範例請見下方連結。一律電子投稿,限用 PDF 檔案格式,格式不符恕不接受投稿。

論文格式範例下載:
參考格式 MS Word: 範本下載 Word Icon

Requirements
  • 2-4 pages
  • IEEE 2-column format
  • PDF format only
  • Original work
  • Author attendance

論文投稿主題

Analog & RF

Subcomm. 1: Analog Circuits and Systems (ACS)
  • Analog Circuits and Sensor Interfaces
  • Medical Devices and Biomedical Systems
  • Imagers and Display Drivers
Subcomm. 2: Data Converters (DC)
  • Nyquist-Rate and Oversampling A/D and D/A Converters
  • Embedded and Application-Specific A/D and D/A Converters
  • Sub-Circuits for Data Converters, Including Sample-and-Hold Circuits, Calibration Circuits, etc.
Subcomm. 3: Power Management and Energy Systems (PMES)
  • Power Electronic Circuits and Systems
  • Power Converters
  • Energy Harvesting Circuits
  • Wireless Power Transfer Circuits and Systems
Subcomm. 4: RF, Wireless, and Wireline (RWW)
  • Wireline (Optical/Electrical) Transceiver Systems and Circuits
  • Wireless Transceiver Systems and Circuits

Digital & System

Subcomm. 5: Digital Circuits and Systems (DCS)
  • Low-Power Logic, Arithmetic Circuits, and Hardware Security
  • Multi-Core Systems, Network-on-Chip, and Embedded SoC Systems
  • Baseband Signal Processing ICs, Communication & AIoT Systems
  • B5G and Satellite Communications
Subcomm. 6: AI and Memory Systems (AIM)
  • Artificial Intelligence Circuits and Systems, Neuromorphic Hardware
  • Memory Hardware Circuits and GPU/NPU Systems
Subcomm. 7: Signal Processing and Healthcare (SPH)
  • Digital Signal Processing ICs, Image/Visual & Multimedia Systems
  • Biomedical, Bioinformatics, Biometrics, and Healthcare Systems

EDA & Testing

Subcomm. 8: Testing and Verification (TV)
  • Fault Model/Simulation, DFT and ATPG
  • Mixed-Signal/RF/Memory/MEMS Tests
  • Chiplet, 2.5D and 3D IC Tests
  • Design and Test for Reliability, Safety and Security
  • AI-based Tests and Testing for AI Systems
  • Design Validation, Verification and Debug
  • Test for Emerging Technologies
Subcomm. 9: Electronic Design Automation for Advanced Technologies and Heterogeneous Integration (EDA-ATHI)
  • AI-Driven Design Automation Across System, Logic, and Physical Levels
  • Physical-Level Design Automation Including Placement, Routing, Optimization, and Physical Verification
  • Timing/Power/Thermal Modeling/Analysis/Optimization and DFM

Emerging Technologies

Subcomm. 10: Emerging Technologies and Applications (ETA)
  • Automotive Electronics and Systems
  • Edge and Cloud Computing
  • Lab-on-a-Chip
  • Quantum Computing Circuits and Systems
  • Others


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